138.049 Electron microscopy
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2024S, PR, 4.0h, 5.0EC, to be held in blocked form
TUWEL

Course evaluation

Properties

  • Semester hours: 4.0
  • Credits: 5.0
  • Type: PR Project
  • Format: Presence

Learning outcomes

After successful completion of the course, students are able to comprehend the materials presented in the course and to draw conclusions from them, as well as to actively communicate the contents presented during the course.

Subject of course

Principle of transmission electron microscopy (TEM)
Practical work
Setup, alignment
- illuminating system
- objective lens
- lens aberrations

Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images

Microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)

Teaching methods

Interactive Course

Mode of examination

Written and oral

Additional information

Planned dates for SS 2024:

There will be three blocks. The first block is dedicated to English speaking students. Please indicate your language requirement when applying to be enrolled.

Theory lecture
Friday, March 8th, 2024

TEM work takes place in the TEM laboratories, 8th floor, yellow tower of the Freihaus, Wiedner Hauptstraße 8-10. Duration: 9am - 1 pm (unless noted otherwise)
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Group 1 (Englisch):
Mon 11.03.(13:00) Tue 12.03. Wed 13.03. Thu 14.03.
Mon 18.03. Tue 19.03. Wed 20.03. Fri 22.3.
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Lecturers

Institute

Course dates

DayTimeDateLocationDescription
Fri10:00 - 13:0008.03.2024Sem.R. DA grün 05 theory lecture
Course is held blocked

Examination modalities

Certificate

Course registration

Begin End Deregistration end
18.01.2024 00:00 29.02.2024 00:00 29.02.2024 00:00

Registration modalities

Please exclusively use the group registration!

Priority is given to those students who need transmission electron microscopy directly for their research and who will apply it independently.

Unfortunately, there is no guarantee for an internship.

Group Registration

GroupRegistration FromTo
Gruppe 1 (English)01.02.2024 00:0028.02.2024 10:05
Gruppe 201.02.2024 00:0020.02.2024 10:05
Gruppe 318.01.2024 00:0020.02.2024 10:05

Curricula

Study CodeObligationSemesterPrecon.Info
066 434 Materials Sciences Not specified
066 460 Physical Energy and Measurement Engineering Not specified
066 461 Technical Physics Not specified
066 461 Technical Physics Mandatory elective
066 490 Technical Chemistry Not specified

Literature

Lecture notes for this course are available.

Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)
Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (recommended) (2008) 

Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)

Accompanying courses

Continuative courses

Miscellaneous

  • Attendance Required!

Language

if required in English