After successful completion of the course, students are able to comprehend the materials presented in the course and to draw conclusions from them, as well as to actively communicate the contents presented during the course.

Principle of transmission electron microscopy (TEM)
Practical work
Setup, alignment
- illuminating system
- objective lens
- lens aberrations

Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images

Microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)

Interactive Course

General Introduction of the lecture:

Tuesday, March 7th, 2023,  13:00-14:00

FH HS6

Vorbesprechung: Dienstag, 01.03.2022, 16.00-18.00 Uhr, FH 8 Nöbauer HS
Planned dates for SS 2023:

There will be three blocks. The first block is dedicated to English speaking students. Please indicate your language requirement when applying to be enrolled.

Theory lecture
Fri 10.03.2023 10:00 - 13:00 Sem.R. DA grün 05

TEM work takes place in the TEM laboratories, 8th floor, yellow tower of the Freihaus, Wiedner Hauptstraße 8-10. Duration: 9am - 1 pm (unless noted otherwise)
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Mon 13.03. (1 pm); Tue 14.03.; Thu 15.03.; Fri 17.03.
Mon 20.03.; Tue 21.03.; Wed 22.03. (1 pm); Thu 23.03.
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Certificate

Priority is given to those students who need transmission electron microscopy directly for their research and who will apply it independently.

Unfortunately, there is no guarantee for an internship.

Lecture notes for this course are available.

Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)
Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (recommended) (2008) 

Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)