AFM-SECM with boron-doped diamond electrodes

01.04.2009 - 31.12.2011
Assigned research project
In this project boron-doped diamond (BDD) will be tested as electrode material for combined atomic force microscopy-scanning electrochemical microscopy (AFM-SECM) tips. They will be used in AFM-SECM to study the reactivity of technical surfaces with features in the nanometre range in complex media. Prototypes will be fabricated from commercially available BDD-coated conductive AFM tips, by insulation with a silicon oxinitride layer followed by focussed ion beam machining of the tip exposing a defined area of BDD as ultramicro- or nano electrode. The behaviour of such tips will be tested by studying model systems. The results will be quantitatively analysed by 2 and 3-dimensional numerical simulations of the amperometric tip response. SECM approach curves will be simulated for non-deformed cantilevers. Attempts will be made to simulate SECM and AFM approach curves with flexible cantilevers. This will require modelling the electrochemical processes at the tip and substrates, the physical interaction between the tip and the substrate and the deformation of the cantilever. Modelling and simulation will help in determining the optimal tip geometry for the AFM-SECM tips. The cone-shaped bifunctional tips will be used also in the development and application of in-situ conductive probe AFM (CP-AFM) as a technique capable to monitor morphological and reactivity (current) properties of electrochemical interfaces simultaneously under reaction conditions. CVD parameters for BDD and silicon oxinitride layer deposition will be tested for the fabrication of BDD AFM-SECM tips.

People

Project leader

Sub project leader

Project personnel

Institute

Contract/collaboration

  • Planai Hochwurzenbahnen Gmbh

Research focus

  • Non-metallic Materials: 10%
  • Biological and Bioactive Materials: 5%
  • Special and Engineering Materials: 10%
  • Structure-Property Relationsship: 5%
  • Nano-electronics: 10%
  • Sensor Systems: 35%
  • Sustainable Production and Technologies: 5%
  • Surfaces and Interfaces: 10%
  • Materials Characterization: 10%

Keywords

GermanEnglish
Atomkraftmikroskopieatomic force microscopie
Elektrochemische Mikroskopiescanning electrochemical microscopy

External partner

  • Department of Chemistry and Biochemistry
  • Institut for Chemistry and Technology of Materials
  • Department of Chemistry

Publications