With the commercial availability of new tools for organic depth profiling (e.g. Ar₁₀₀₀ gas cluster ion beams) it is now possible to analyse organic multilayer systems while retaining the molecular information. To get valid information on the chemical in-depth distribution of organic compounds appropriate organic reference materials with sharp interfaces and interlayers at known depths are necessary for the development, optimization and validation of analytical methods. Self Assembled Monolayers (SAM) and Metal Organic Frameworks (MOF), due to their controlled layer formation, are expected to meet these requirements. R&D and quality control in recent applications of organic layer stacks in molecular electronics, organic photovoltaics and biosensing devices relies on valid methods for organic depth profiling and layer quantification.

It is the aim of this project to characterise the surface and interface of layered organic samples and ionic liquids by surface analysis techniques such as Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS), X-ray Photoelectron Spectroscopy (XPS) and Low Energy Ion Scattering (LEIS). Further the suitability of SAMs and MOFs as potential new organic reference materials for the establishment of valid methods of organic depth profiling is explored as well as the suitability of ionic liquids to act as reference material for the calibration of energy and intensity scales to improve the quantification of organic surface analysis.