Christian Doppler Laboratory for Surface and Interface Analysis with TOF-SIMS

01.07.2007 - 31.12.2009
Research funding project
The CDL for Surface- and Interface Analysis with TOF SIMS is a cooperation of the TU Vienna with AT&S (www.ats.net), a world-wide leading manufacturer of printed circuits boards (PCB). These PCBs are complex, yet well-defined, structured composites of metals and polymers. For further developments of miniaturized structures with increased functionality it is necessary to make use of high end analytical methods. TOF-SIMS, the mainly used analysis methode, is an essential tool for this task due to the capability of analyzing three dimensional trace element distributions as well as characterizing organic surfaces. However, due to the complex three dimensional compositions further developments of advanced measurement techniques, data interpretation, and data visualization are necessary. The activities of the CDL focuses on the assistance of the progress of production technology for high-tech products at internationally reviewed level rather than to establish an analysis service for AT&S. For this assistance prolonged cooperation of a surface analysis group with the industry is required. For the analysis of metal-polymer composites several analytical problems of basic research is established. Metal-metal interfaces have already been investigated intensely, but the characterization of metal-polymer, polymer-polymer and polymer-ceramic interfaces is an unsolved challenge today. One further topic is the advanced evaluation of multi dimensional data considering the special requirements of TOF-SIMS data. We will develop an interactive data processing and visualization software tool for the TOF-SIMS data, as the standard software of the instrument suppliers is less than satisfying with regards to this field. Secondly, to be able to identify molecules it will be necessary to build up a spectra library of the relevant substances. And thirdly, we will develop advanced tools for multivariate data analysis. We intend to provide all those tools to the TOF-SIMS community under an open source license

People

Project leader

Project personnel

Institute

Grant funds

  • Christian Doppler Forschungsgesells (National) Christian Doppler Research Association (CDG)

Research focus

  • Composite Materials: 20%
  • Surfaces and Interfaces: 50%
  • Materials Characterization: 30%

Keywords

GermanEnglish
TOF-SIMSTOF-SIMS
OberflächenanalytikSurface Analysis
WerkstoffanalytikMaterial Science
LeiterplattenCircuit Bords

External partner

  • Christian Doppler Forschungsgesellschaft

Publications