Device Degradation and Recovery for Circuit Simulation

01.03.2020 - 30.09.2023
Assigned research project

People

Project leader

Institute

Contract/collaboration

  • Infineon Technologies AG

Research focus

  • Modeling and Simulation: 100%

Keywords

GermanEnglish
ZuverlässigkeitSchaltungen
SchaltungszuverlässigkeitCircuit reliability

Publications