The magnetic state of a surface can be analyzed by a plethora of methods available. When it comes to two-dimensional systems, however, conventional methods typically do not possess the possibility to resolve a magnetic signal from the topmost surface layer from the material underneath. With the project DIMAS TU Wien and CNRS/Sorbonne Université will develop a completely new technique of ion scattering and simultaneous detection of characteristic X-ray emission in order to characterize 2D magnetic systems. With this method the magnetic state (ferromagnetic, paramagnetic, antiferromagnetic) of a 2D magnet can be detected and distinguished from the substrate material. The latter is enabled by the extreme surface sensitivity of highly charged ions used in the project.

The applications of the new method are centered around the characterization of the newly discovered two-dimensional magnetic layers. With the help of this project and the methodology developed within it, new energy efficient and powerful magnetic storage devices may be developed in the near future.