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Ao.Univ.Prof. Mag.rer.nat. Dr.rer.nat.
Jürgen Smoliner
Phone
+43 1 58801 36212
E-Mail
juergen.smoliner@tuwien.ac.at
Assigned
E362-01
Research Unit of Optoelectronic Materials
Business Card
Affiliations
Profile
Keywords
Reference projects
Journals
Events / Conferences
Research area
Name
Management/Member
Research Unit of Optoelectronic Materials
Member
Profile
Research profile (German):
Das Forschungsgebiet der Halbleiter und Nanoelektronik beschäftigt sich mit dem elektronischen Transport, also dem Stromtransport in Halbleiterstrukturen bis in den Nanometerbereich. Der Hintergedanke ist dabei entweder die Suche nach Möglichkeiten für neue Bauelemente oder der Gewinn an Verständnis der physikalischen Prozesse (quantisierte Energieniveaus, Spineffekte etc) in bekannten Strukturen. Als Methoden kommen dabei hauptsächlich Strommessungen, Kapazitätsmessungen und Photoleitungsmessungen zum Einsatz, die auch bei tiefsten Temperaturen und Magnetfeldern durchgeführt werden. Für Messungen auf Nanostrukturen werden Kontakte durch Elektronenstrahl-Lithographie sowie verschiedene Rastersondenmikroskope (AFM, STM) verwendet.
Research profile (English):
Research field solid states and nano-electronics is concerned with the transport of electric charge in solid state structures at nano meter scale. The idea behind is either the search for concepts for new components or the gain in understanding of the physical processes (quantized energy levels, spin effects etc) in known structures. The methods used here are mainly current measurements, capacitance measurements and photoconductivity measurements are used, which are carried out at low temperatures and magnetic fields. For measurements on nanostructures contacts by electron beam lithography and various scanning probe microscopes (AFM, STM) can be used.
Link to CV:
http://fke.tuwien.ac.at/forschung/scanning_probe_techniques/
Publications:
Publications
Keywords
Keyword (German)
Keyword (English)
SMM
SMM
Nanoelektronik
Nanoelectronics
Rastersondenmethoden
Scanning Probe Methods
AFM / STM
AFM /STM
SCM
SCM
BEEM
BEEM
Research Focal Areas
Research focus
Research field
Keywords
Percentage
Quantum Physics and Quantum Technologies
Quantum Metrology and Precision Measurements
Attosecond physics, matter wave interferometry, sensorics
50
Quantum Physics and Quantum Technologies
Nanoelectronics
Quantum transport, quantum structures, nano-scale fabrication, quantum devices
50
Faculty focus
Faculty focus
Percentage
Mikro- und Nanoelektronik
100
Area of expertise according to Statistik Austria
Code
Area of expertise (German)
Area of expertise (English)
2524
Physikalische Elektronik
Physical electronics
1229
Halbleiterphysik
Semiconductor physics
2517
Halbleitertechnologie
Semiconductor technology
1245
Nanotechnologie
Nanotechnology
Reference Projects
Title
Funding program
Function
Website
From
Until
National, FFG - Austrian Research Promotion Agency
InfraRed Optical Nanostructures (IR-ON)
structural program
http://www.ir-on.at/
01.03.2005
31.12.2012
Journal participation
Title
Classification
Referenced
Function
From-To
Comment
Applied Physics Letters
SCI (Science Citation Index)
Yes
Reviewer
-
EPL Letters
unclassified
Yes
Reviewer
-
IEEE Transactions on Electron Devices
unclassified
Yes
Reviewer
-
Journal of Applied Physics
SCI (Science Citation Index)
Yes
Reviewer
-
Journal of Physics D
unclassified
Yes
Reviewer
-
Nanotechnology
SCI (Science Citation Index)
Yes
Reviewer
-
Physica Status Solidi
unclassified
Yes
Reviewer
-
Physics Review B
unclassified
Yes
Reviewer
-
Physics Review Letters
unclassified
Yes
Reviewer
-
Review of Scientific Instruments
SCI (Science Citation Index)
Yes
Reviewer
-
Semiconductor Science and Technology
unclassified
Yes
Reviewer
-
Superlattices and Microstructures
SCI (Science Citation Index)
No
Reviewer
-
Thin Solid Films
SCI (Science Citation Index)
Yes
Reviewer
-
Events / Conferences
Category
Collaboration
Event name
From
Until
Function/Comments
Scientific Conference / Symposium
Teilnehmer_in
28th Int. Conference on Semiconductor Physics
07/2006
07/2006
Scientific Conference / Symposium
Organisator_in
European Conference on Electrical Measurements at the Nanoscale Using AFM
07/2012
07/2012
Scientific Conference / Symposium
Organisator_in
ICPS International conference of semiconductor physics
01/2006
08/2006
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