Person profile

Ao.Univ.Prof. Dipl.-Ing. Dr.

Dionyz Pogany

Phone +43 1 58801 36224

E-Maildionyz.pogany@tuwien.ac.at

Assigned

E362-02

Business Card

Research area

Name	Management/Member
Research Unit of Nanoelectronic Devices	Member

Profile

Research profile (German):

Mittels optischen und elektronischen Methoden untersuchen wir Erhitzungseffekte und interne Temperaturverteilungen in Leistung, ESD Schutz und optoelektronischen Geräten mit Nanosekundenauflösung. Ein weiteres Forschungsfeld ist die Charakterisierung von Interferenzen und Zuverlässigkeit in GaN Bauelementen, hauptsächlich für Leistungsanwendungen.

Research profile (English):

Using transient optical and electrical methods we investigate self-heating effects and internal current/temperature distribution in power, ESD protection and opto-electronics devices with ns time resolution. Another field of research is the characterization of interface states, breakdown phenomena and reliability in GaN based devices, mainly for power applications. Fluctuation phenomena in nanostructures are also investigated.

Additional information:

only on request

Publications:

Publications

Keywords

Keyword (German)	Keyword (English)
GaN Bauelemente Charakterisierung	GaN device characterisation
optische testen von Halbleiterbauelemente	optical testing of semiconductor devices
halbleiterphysik	semiconductor physics
selbsterwärmugseffekte	self-heating effects
Züverlässigkeit der Bauelementen	device reliability
Rauchensanalyse	low frequency noise analysis

Research Focal Areas

Research focus	Research field	Keywords	Percentage
Quantum Physics and Quantum Technologies	Nanoelectronics	Quantum transport, quantum structures, nano-scale fabrication, quantum devices	100

Faculty focus

Faculty focus	Percentage
Mikro- und Nanoelektronik	100

Area of expertise according to Statistik Austria

Code	Area of expertise (German)	Area of expertise (English)
2521	Mikroelektronik	Microelectronics
1213	Optik	Optics
2215	Messtechnik	Measurement technology

Journal participation

Title	Classification	Referenced	Function	From-To
Applied Physics Letters	SCI (Science Citation Index)	Yes	Reviewer	-
Applied Surface Science	SCI (Science Citation Index)	Yes	Reviewer	-
Electronics Letters	unclassified	Yes	Reviewer	-
IEEE Electron Device Letters	SCI (Science Citation Index)	Yes	Reviewer	-
IEEE Microwave and Wireless Components Letters	unclassified	Yes	Reviewer	-
IEEE Nanotechnology	unclassified	Yes	Reviewer	-
IEEE Transactions on Electron Devices	SCI (Science Citation Index)	Yes	Reviewer	-
IEEE Transactions on Material and Device Reliability	unclassified	Yes	Reviewer	-
IET Circuits, Devices & Systems	unclassified	Yes	Reviewer	-
J. Vacuum Science and Technology B	unclassified	Yes	Reviewer	-
Journal of applied Physics	unclassified	Yes	Reviewer	-
Solid State Electronics, Electronics Letters	unclassified	Yes	Reviewer	-
Superlattices and microstructures	unclassified	Yes	Reviewer	-

R&D Accomplishments

Description	From	Until
Other categories
Begutachter zur Doktoratschrift Aumaury Gendron, March 2007, LAAS Toulouse Frankreich, member of jury	03/2007	03/2007
Begutachter zur Doktoratschrift von M.Denison, Universität Bremen, Jurymitglied	12/2004
Begutachtung PhD thesis Patrice Besse, LAAS Toulouse, member of jury	01/2004	01/2004
PhD comitteesP. Lagger, Physics and characterization of the gate stack in gallium nitride based MIS-HEMTs, 16 Sept 2014I. Zbierska, Study of electrical characteristics of tri-gate nMOS transistor in bulk technology, University Clause Bernard-Lyon 1, Villeurbanne, France, 11th Dec 2014B. Courivaud, Developpement et realization de nouvelles structures de protection contre les decharges electrostatic, 5th Feb. 2015	01/2014	01/2015
PhD committeesW. Mamanee: Investigation of current filament behavior in smart power technology ESD protection devices subjected to long ESD-like pulses, 30th March 2012, Vienna, H. Köck, ¿ Experimental and numerical study on heat transfer problems in microelectronics devices, Alpen-Adria-Universität Klagenfurt, 2012F. Lecourt, ¿Heterostructures AlGaN/GaN et InAlN/GaN pour la realisation de HEMTs de puissance hyperfrequence en bande Ka¿, Universite des Sciences et Technologies de Lille,	01/2012	12/2012
PhD committesJ. Bourgeat, ¿Study of advanced CMOS technology thyristors for implementation in local and global strategies for electrostatic discharge protection¿, Toulouse , Nov. 2011.M. Heer, ¿Semiconductor devices and integrated circuits under short electrical stress¿, Feb 2012A. Delmas, ¿Study of triggering behavior of high-voltage ESD protection transistors, Nov. 2011, Toulouse.	01/2011	12/2012
R. Luptak: ¿Investigation of material behavior for advanced structures¿, Bratislava, August 2008.	01/2008	12/2008
V. Lavchiev, ¿Nanostructured Optoelectronic devices compatible with Si¿ , April 2009, Linz. PhD committe	01/2009	12/2009
Y. Gao ¿Modeling and protection strategies adopted for electrostatic discharge events according to charged device model¿, Feb 2009, Toulouse (F)A. Griffoni , ESD and ionizing radiation effects on ultrathin body SOI and multiple gate technology¿, Jan 2010, reviewer.PhD comittees	01/2009	12/2010

Events / Conferences

Category	Collaboration	Event name	From	Until	Function/Comments
Scientific Conference / Symposium	eingeladene_r Sprecher_in	IEEE-LEOS Conference, Tucson	10/2003	10/2003	"Transient interferometric mapping of temperature and free carriers in semiconductor devices", in "Lasers and Electro-Optics for Semiconductor Testing" workshop
Scientific Conference / Symposium	eingeladene_r Sprecher_in	ESREF 2011 conference Bordeaux	10/2011	10/2011	Application of transient interferometric mapping method for ESD and latch-up analysis
Scientific Conference / Symposium	Sonstiges		01/2005	01/2015	EOS ESD symposium
Scientific Conference / Symposium	Sonstiges		01/2000	02/2015	ESREF conference
Scientific Conference / Symposium	eingeladene_r Sprecher_in	International ESD workshop (IEW)	05/2014	05/2014	GaN electronics and optoelectronics from ESD perspective
Scientific Conference / Symposium	Sonstiges		01/2010	01/2015	IEW (ESD workshop)
Scientific Conference / Symposium	eingeladene_r Sprecher_in	Taiwan ESD and Reliability Conference, Hsinchu City	11/2014	11/2014	Probing the current flow, thermal and free-carrier dynamics in ESD protection devices during ESD stress by TIM technique
Scientific Conference / Symposium	eingeladene_r Sprecher_in	Int. Workshop on Diagnostics of Solid State Surfaces and Interfaces	06/1998	06/1998	Thermal investigation of thin film semiconductor devices by optical interferometry
Scientific Conference / Symposium	eingeladene_r Sprecher_in	GAAS conference, Munich	10/2003	10/2003	Thermal mapping of semiconductor devices with nanosecond resolution
Scientific Conference / Symposium	eingeladene_r Sprecher_in	European microwave week 2006	09/2006	09/2006	¿Thermal characterization of high frequency three and two terminal devices¿, Workshop ¿Teraherz devices, design, modelling and characterization¿