After successful completion of the course, students are able to categorize optical metrology systems for the target physical quantity and choose a proper system based on requirements of the target application. For that, students are able to distinguish physical values measured by optics such as radiometry and photometry, and draw the structure and operation principle of basic optical components (laser, photodiodes, CCD, ...). Based on the physics and the basic components for optical metrology, students are able to design a complete optical metrology system such as laser Doppler Vibrometer, speckle interferometry, and lidar, explain the benefits and drawback of each optical metrology system, and justify the choice of the tool in various application examples.
After successful completion of the lab classes, student are able to build optical measurement systems (Michelson interferometry and speckle interferometry) from the basic optical components on an optical breadboard and calculated the target physical quantity from the measured data. In addition, students are able to operates the advanced optical metrology systems (laser Doppler Vibrometer, Thermal camera, wavefront sensor, and lidar) and demonstrate its advantages and limitations in various applications.
Fundamentals of Measurement
Concept, SI units, uncertainty
Introduction to Optical Metrology
optical radiation, light, EM wave, spectrum
Detecting optical radiation
Radiometric and photometric quantities
Optical radiation as EM wave
Description, characteristics, polarization, light/matter interaction, dispersion, refraction, reflection, transmission
Radiation sources and optical radiation
Natural sources of radiation, thermal radiation
Optical temperature measurement
Pyrometers, thermal imaging
Laser
Properties, setup, types of lasers, Gaussian beam, coherence
Interferometer
Michelson, Mach-Zehnder and Sagnac interferometer Coherence-tomography
Semiconductor light sources and semiconductor laser
Detectors
Photoelectric effect, photoelectric cell and photomultiplier, semiconductor detectors (diodes, PSD, CCD and CMOS), thermal detectors (QWIP, thermopile, bolometer, pyro-electric)
Speckle metrology and holography
Properties of laser speckle interferometer, speckle correlation, holographic interferometry
Optical flow measurement
Optical Doppler effect, Laser Doppler Anemometer, Particle Dynamics Analysis, Particle Image Velocimetry, Vibrometer, Schlieren optics
Light Detection and Ranging (LIDAR)
Optical Ranging Principle, Reflection from Materials, SNR and performance, Scanning and Nonscanning LIDAR
Wavefront Sensing (WFS)
Diffraction Imaging, Principle, Aberration, Measurements
* The 2 days lab exercises are organized with two groups. Students will be asigned on either group A or B.
