Background and physical principles at the nanometer scale, forces, limits, scaling-effects, high-resolution imaging systems, SEM, TEM, Scanning Tunnelling Microscopy (STM), Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KPFM), Magnetic Force Microscopy (MFM), force measurement, single molecule spectroscopy, dynamics of AFM and video-rate AFM, image processing, nano-mechanical characterization, nanoindentation, nanolithography, particle manipulation, nano-robotics, scientific instrumentation, physical sensor and actuator principles.
![Commercial AFM from Bruker Cooperation](http://www.acin.tuwien.ac.at/fileadmin/Nanometrology1.JPG)
![MFM image of a hard disc drive (HDD).](http://www.acin.tuwien.ac.at/fileadmin/Nanometrology2.png)
- Oral exam, 2-3 weeks after the course (date/time see under exam): 50%
- Seminar presentation: 25%
- Short lab report: 25%
Attendance at lectures and lab practicals is compulsory (in-person)!
Due to the coronavirus pandemic it may be necessary to change the course modalities on short notice.