After successful completion of the course, students are able to

• understand degradation mechanisms of semiconductor devices in detail.
• Implement theoretical reliability models or characterize the reliability of various technologies metrologically (dependent on the chosen focus).

Application of the theoretical knowledge taught in the two VUs of this module.

Several choices:

• Implementation of a certain reliability problem in a computer code.
• Measurement of device reliability on one of our high-speed measuring units including data analysis.

Independent work on a project.

In case you are interessted to participate this course, please contact the lecturers.

Presentation of the work in front of peers.