360.234 Microelectronic Reliability
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2019W, SE, 2.0h, 3.0EC

Properties

  • Semester hours: 2.0
  • Credits: 3.0
  • Type: SE Seminar

Learning outcomes

After successful completion of the course, students are able to

  • understand degradation mechanisms of semiconductor devices in detail.
  • Implement theoretical reliability models or characterize the reliability of various technologies metrologically (dependent on the chosen focus).

Subject of course

Application of the theoretical knowledge taught in the two VUs of this module.

Several choices:

  • Implementation of a certain reliability problem in a computer code.
  • Measurement of device reliability on one of our high-speed measuring units including data analysis.

Teaching methods

Independent work on a project.

Mode of examination

Immanent

Additional information

Please consider the plagiarism guidelines of TU Wien when writing your seminar paper: http://www.tuwien.ac.at/fileadmin/t/ukanzlei/t-ukanzlei-english/Plagiarism.pdf
Please consider the plagiarism guidelines of TU Wien when writing your seminar paper: https://www.tuwien.ac.at/fileadmin/t/ukanzlei/t-ukanzlei-english/Plagiarism.pdf
Please consider the plagiarism guidelines of TU Wien when writing your seminar paper: https://www.tuwien.at/fileadmin/Assets/dienstleister/Datenschutz_und_Dokumentenmanagement/Plagiarism.pdf

Lecturers

Institute

Examination modalities

Presentation of the work in front of peers.

Course registration

Not necessary

Curricula

Literature

No lecture notes are available.

Language

German