After successful completion of the course, students are able to apply the discussed topics in an independent and sustainable manner, in order to solve fundamental and technological problems in research.
Infrared-Reflection-Absorption-Spectroscopy (IRAS), Raman Spectroscopy (SERS), X-ray and UV Photoelectron Spectroscopy, Auger Spectroscopy, Microspectroscopy and Spectromicroscopy, X-ray Absorption Spectroscopy (EXAFS), X-Ray Diffraction (XRD), Low-Energy-Electron-Diffraction (LEED), Transmission-Electron-Diffraction (TED), Transmission- and Scanning Electron Microscopy, Analytical Electron Microscopy (SAED, EDX, EELS), (Kautek) Fundamentals of Optical and Electron Microscopy, Bright and Dark Field Techniques, Phase and Interference Contrast, Fluorescence Microscopy, Fluorescence Resonance Energy Transfer (FRET), Confocal Microscopy, Nonlinear Optics - Multiphoton Fluorescence Microscopy, Second Harmonic Generation at Interfaces, Laser-Induced Breakdown Spectroscopy (LIBS), Scanning Tunneling Microscopy (STM), Scanning Force Microscopy (SFM), Optical Nearfield (Fundamentals), Aperture Scanning Nonlinear Optical Microscopy (SNOM), Scattering SNOM, Aperturless SNOM, fs-SNOM, Total Internal Reflection Fluorescence (TIRF), Voltammetry of Microparticles (VMP), Electrochemical Quartz Microbalance (EQMB), In-situ Grazing Incidence X-Ray Diffractometry (GIXD), Electrochemical Nanotribology, Electrochemical Laser Activation/Depassivation, Scanning Electrochemical Microscopy (SECM)
Start:
First Lecture at TU: Tuesday 19.11.2019, 13:30-16:30h (Seminarraum Lehar 01).
The Lecture will start with the part of Prof. Bismarck (Pre-meeting 15.10.2019, 13:00h,1090 Wien, Währinger Straße 42, Raum 2140).
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