The theory of strain and texture analysis using X-ray diffraction and microdiffraction methods on polycrystalline materials. Independent setup of measurements. Analysis of the acquired data.

Selected examples of strain, texture, microdiffraction and thin-film measurements.

Strain measurements: Theoretical background, measurement techniques for bulk samples and thin films, data reduction/correction, practical course on the instrument.

Texture: Theoretical background, measurement techniques, data reduction/correction, computation of the orientation distribution function, practical course on the instrument.

Microdiffraction: Measurement techniques for beam sizes in the micro- (lab) and nano-scale (synchrotron).

Thin layers: Theoretical background, measurement techniques and device geometries (gracing incident, strain and texture, high resolution methods).

Oral exam