164.337 Röntgendiffraktion II: Advanced Methods
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2019S, VU, 2.0h, 3.0EC, to be held in blocked form


  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VU Lecture and Exercise

Aim of course

The theory of strain and texture analysis using X-ray diffraction and microdiffraction methods on polycrystalline materials. Independent setup of measurements. Analysis of the acquired data.

Subject of course

Selected examples of strain, texture, microdiffraction and thin-film measurements.

Strain measurements: Theoretical background, measurement techniques for bulk samples and thin films, data reduction/correction, practical course on the instrument.

Texture: Theoretical background, measurement techniques, data reduction/correction, computation of the orientation distribution function, practical course on the instrument.

Microdiffraction: Measurement techniques for beam sizes in the micro- (lab) and nano-scale (synchrotron).

Thin layers: Theoretical background, measurement techniques and device geometries (gracing incident, strain and texture, high resolution methods).



Course dates

Wed14:00 - 14:3027.03.2019 Seminarraum 1. Stock, Bauteil BLVorbesprechung
Mon09:00 - 11:3020.05.2019 Seminarraum BD 02CVorlesung
Mon13:00 - 16:0020.05.2019 Seminarraum Lehar 01Vorlesung
Tue09:00 - 11:3021.05.2019 Sem.R. DC rot 07Vorlesung
Tue13:00 - 16:0021.05.2019 Seminarraum BD 02CVorlesung
Wed09:00 - 11:3022.05.2019 Seminarraum BD 02CVorlesung
Thu09:00 - 11:3023.05.2019 Seminarraum Lehar 01Vorlesung
Fri09:00 - 11:3024.05.2019 Seminarraum 8Vorlesung
Course is held blocked

Examination modalities

Oral exam

Course registration

Not necessary



No lecture notes are available.

Preceding courses