After successful completion of the course, students are able to categorise different probe techniques with different particles, to explicate physical fundamentals, to describe data processing, to list applications as well as to constitute their advantages and disadvantages.
Overview on most important methods: photon probe techniques: surface analytical aspects of vibrational spectroscopy (RAMAN (SERS), IR (reflection- absorption technique)), x-ray absorption spectrometry (EXAFS, NEXAFS), photoelectron spectroscopy (XPS, UPS); electron probe techniques: analytical electron microscopy (TEM, THEED, TEELS), electron diffraction (LEED, RHEED), electron energy loss spectroscopy (EELS, REELS), scanning electron microscopy, electron probe microanalysis (EPXMA/SEM), Auger electron spectroscopy (AES); ion probe techniques: scatter methods (RBS, ISS), elastic recoil detection (ERD), sputter methods (secondary ion mass spectrometry (SIMS), secondary neutrals mass spectrometry (SNMS)), activation analysis (CPAA); field probe techniques: field ion microscopy, atom probe analysis; near-field scanning probe techniques: AFM, STM, SNOM. Physical fundamentals, instrumentation, data processing (quantification), and analytical figures of merit (scope and limitation). Discussion of examples for applications with advantages and disadvantages of different methods.
