141.211 X-ray analytical methods
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2022S, VO, 2.0h, 3.0EC, to be held in blocked form


  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VO Lecture
  • Format: Hybrid

Learning outcomes

After successful completion of the course, students are able to...

  • Describe X-ray tubes, synchrotron radiation sources and their function
  • Explain interactions of photons with matter
  • Describe energy dispersive XRF,
  • describe how to improve detection limits for trace analysis
  • describe how to quantify in XRF
  • Explain details of special methods of XRF like (TXRF, 2D and 3 D imaging, micro XRF)
  • Apply the learned methods  to medical, industrial, biological and environmental questions.
  • Decide which analytical method is best suited for a specific problem

Subject of course

  • Introduction to X-ray physics,
  • Introduction to X-ray fluorescence analysis (XRF)
  • X-ray sources,
  • Energy dispersive XRF
  • X-ray optics.
  • Introduction to Various methods of X-ray analysis
  • XRF
  • 2D and 3 D X-ray imaging,
  • X-ray absorption spectroscopy,(XANES, EXAFS)
  • Microanalysis, (µ-XRF)
  • Total Reflection XRF (TXRF),
  • Synchrotron radiation induced XRF (SR-XRF)


Teaching methods

The fundamentals underlying the various methods will be reviewed, and their applicability will be discussed drawing on case studies. 

Mode of examination




Course dates

14:30 - 18:0016.05.2022 - 19.05.2022 X-ray practicum labblock
X-ray analytical methods - Single appointments
Mon16.05.202214:30 - 18:00 X-ray practicum labblock
Tue17.05.202214:30 - 18:00 X-ray practicum labblock
Wed18.05.202214:30 - 18:00 X-ray practicum labblock
Thu19.05.202214:30 - 18:00 X-ray practicum labblock
Course is held blocked

Examination modalities

Oral exam ( also online via zoom)

Course registration

Begin End Deregistration end
04.03.2022 00:00 30.06.2022 00:00



Handbook of X-ray Spektrometry, Marcel Dekker 2002, Van Grieken, Markowicz X-ray Spectrometry: recent technological advances, Wiley 2004, Tsuji, Injuk, Van Grieken,

Preceding courses