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141.211
X-ray analytical methods
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.
2024S
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2007W
2006W
2019S, VO, 2.0h, 3.0EC
Properties
Semester hours: 2.0
Credits: 3.0
Type: VO Lecture
Aim of course
Introduction to X-ray analysis, performance and limitations and applications
Subject of course
I
Introduction to X-ray physics,
Introduction to X-ray fluorescence analysis (XRF)
X-ray sources,
Energy dispersive XRF
X-ray optics.
Introduction to Various methods of X-ray analysis
XRF
2D and 3 D X-ray imaging,
X-ray absorption spectroscopy,(XANES, EXAFS)
Microanalysis, (µ-XRF)
Total Reflection XRF (TXRF),
Synchrotron radiation induced XRF ( SR-XRF)
Lecturers
Streli, Christina
Institute
E141 Atomic and Subatomic Physics
Course dates
Day
Time
Date
Location
Description
Mon
16:00 - 17:00
04.03.2019
Seminarraum AI
Vorbesprechung
14:00 - 18:00
14.05.2019 - 17.05.2019
Meeting point Aula Atominstitut
Block lecture
Show single appointments
X-ray analytical methods - Single appointments
F
P
1
N
E
Day
Date
Time
Location
Description
Mon
04.03.2019
16:00 - 17:00
Seminarraum AI
Vorbesprechung
Tue
14.05.2019
14:00 - 18:00
Meeting point Aula Atominstitut
Block lecture
Wed
15.05.2019
14:00 - 18:00
Meeting point Aula Atominstitut
Block lecture
Thu
16.05.2019
14:00 - 18:00
Meeting point Aula Atominstitut
Block lecture
Fri
17.05.2019
14:00 - 18:00
Meeting point Aula Atominstitut
Block lecture
F
P
1
N
E
Examination modalities
oral examination
Course registration
Begin
End
Deregistration end
01.05.2019 00:00
01.10.2019 00:00
Curricula
Study Code
Obligation
Semester
Precon.
Info
066 461 Technical Physics
Mandatory elective
066 461 Technical Physics
Mandatory elective
Literature
Handbook of X-ray Spektrometry, Marcel Dekker 2002, Van Grieken, Markowicz X-ray Spectrometry: recent technological advances, Wiley 2004, Tsuji, Injuk, Van Grieken,
Go to Course Materials
Preceding courses
134.048 VO Physical Analytics
Language
English