141.211 X-ray analytical methods
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2019S, VO, 2.0h, 3.0EC

Properties

  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VO Lecture

Aim of course

Introduction to X-ray analysis, performance and limitations and applications

Subject of course

I

  • Introduction to X-ray physics,
  • Introduction to X-ray fluorescence analysis (XRF)
  • X-ray sources,
  • Energy dispersive XRF
  • X-ray optics.
  • Introduction to Various methods of X-ray analysis
  • XRF
  • 2D and 3 D X-ray imaging,
  • X-ray absorption spectroscopy,(XANES, EXAFS)
  • Microanalysis, (µ-XRF)
  • Total Reflection XRF (TXRF),
  • Synchrotron radiation induced XRF ( SR-XRF)

 

Lecturers

Institute

Course dates

DayTimeDateLocationDescription
Mon16:00 - 17:0004.03.2019Seminarraum AI Vorbesprechung
14:00 - 18:0014.05.2019 - 17.05.2019 Meeting point Aula AtominstitutBlock lecture
X-ray analytical methods - Single appointments
DayDateTimeLocationDescription
Mon04.03.201916:00 - 17:00Seminarraum AI Vorbesprechung
Tue14.05.201914:00 - 18:00 Meeting point Aula AtominstitutBlock lecture
Wed15.05.201914:00 - 18:00 Meeting point Aula AtominstitutBlock lecture
Thu16.05.201914:00 - 18:00 Meeting point Aula AtominstitutBlock lecture
Fri17.05.201914:00 - 18:00 Meeting point Aula AtominstitutBlock lecture

Examination modalities

oral examination

Course registration

Begin End Deregistration end
01.05.2019 00:00 01.10.2019 00:00

Curricula

Study CodeObligationSemesterPrecon.Info
066 461 Technical Physics Mandatory elective
066 461 Technical Physics Mandatory elective

Literature

Handbook of X-ray Spektrometry, Marcel Dekker 2002, Van Grieken, Markowicz X-ray Spectrometry: recent technological advances, Wiley 2004, Tsuji, Injuk, Van Grieken,

Preceding courses

Language

English