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141.115 Practical Coursw in X-ray Analytical Methods
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2025S, PR, 2.0h, 3.0EC, to be held in blocked form

Properties

  • Semester hours: 2.0
  • Credits: 3.0
  • Type: PR Project
  • Format: Presence

Learning outcomes

After successful completion of the course, students are able to...

  • analyse a sample qualitatively with EDXRF/qualitatively by XRD
  • decide which application is useful for XRF, micro-XRF, TXRF and secondary target XRF
  • to deconvolute X-ray spectra
  • to perform simple quantitative analysis/perform simple quantiative phase analytics by XRD

Subject of course

  • Energy dispersive X-ray Fluorescence Analysis (EDXRF)
  • Total Reflection X-ray Fluorescence Analysis (TXRF)
  • Micro-XRF
  • Secondary target XRF
  •  Quantification, Calibration, Trace element analysis
  • Qualitative/quantitative phase analysis of polycrystalline materials by X-ray diffraction methods (solid-state materials, thin films)

Teaching methods

After an introduction to  the topic the analysis is demonstrated. Further measurements, data evaluation and interpretations is performed by the students. Concluding a final report should demonstrate that the individual methods are understood and results are presented

Mode of examination

Written and oral

Lecturers

Institute

Examination modalities

written report and final discussion

Course registration

Begin End Deregistration end
07.03.2025 00:00 12.05.2025 00:00

Curricula

Study CodeObligationSemesterPrecon.Info
800 FW Elective Courses - Technical Chemistry Elective
810 Technical Physics Mandatory elective
810 Technical Physics Mandatory elective

Literature

Lecture notes for this course are available.

Preceding courses

Miscellaneous

  • Attendance Required!

Language

English