141.044 Methods of Quantitative X-ray Fluorescence Analysis
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2015S, VO, 2.0h, 3.0EC

Properties

  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VO Lecture

Aim of course

Review of methods to convert intensities of characteristic fluorescence lines into concentration of the respective element which is present in the sample

Subject of course

1. Basic principles of X-ray Fluorescence Analysis (XRF). Qualitative Analysis - Peak fitting models, Background calculations: 2. Quantitative Analysis: General approach - thick - intermediate thick - thin sample approximation.

Lecturers

Institute

Course dates

DayTimeDateLocationDescription
Tue16:00 - 17:0014.04.2015 Start lecture
Tue10:00 - 13:0012.05.2015Seminarraum AI Methods of Quantitative x-Ray Fluorescence Analysis
Tue10:00 - 13:0019.05.2015Seminarraum AI Methods of Quantitative x-Ray Fluorescence Analysis
Tue10:00 - 13:0026.05.2015Seminarraum AI Methods of Quantitative x-Ray Fluorescence Analysis
Tue10:00 - 13:0002.06.2015Seminarraum AI Methods of Quantitative x-Ray Fluorescence Analysis

Examination modalities

(mündlich) oral

Course registration

Begin End Deregistration end
05.03.2015 16:15

Registration modalities:

Atominstitut, library: preliminary discussion

Curricula

Literature

Lecture notes for this course are available. Lecturer

Previous knowledge

Atom and Nuclear Physics, Radiation Physics, Special techniques in XRF

Language

English