138.103 Techniques of analytical elctron microscopy
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2019W, VO, 2.0h, 3.0EC

Properties

  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VO Lecture

Learning outcomes

After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.

Subject of course

With respect to the lecture notes (in German language) the structure of the lecture is as follows:

  1. Introduction to the analytial methods
  2. elastic electron scattering (Rutherford scattering, screened Potential, Bragg scattering, phonon scattering)
  3. inelastic electron scattering (Bethe theory, dielectric formalism, plasmon excitations, differetial scattering crossection, KKA, multiple scattering, ionization, ELNES)
  4. electron energy loss spectrometry (spectrometer, energy resolution, detection, detection limits, spatial resolution)
  5. energy filtered TEM (ZLP filtering, plasmon filtering, elemental maps)
  6. X-ray spectrometry (detector, excitation volums, nomenclature, artifacts)
  7. cathodoluminescence (spectrometer, diffraction at a slit, diffration at a lattice, electron-hole-pair recombination, Cerenkov radiation, transition radiation)
  8. chemical microanalysis (in EELS, in EDX)
  9. actual research topics (plsamonics, phase manipulation, orbital mapping)

 

Teaching methods

Frontal Lecture

Mode of examination

Oral

Additional information

Lecture notes for this course are available for 15 EUR. The lecture notes are further used for the  LVA 133.293 Electron Microscopy: Principles & Fundamentals.

Lecturers

Institute

Course dates

DayTimeDateLocationDescription
Mon12:00 - 13:0007.10.2019FH Hörsaal 6 Vorbesprechung
Mon14:00 - 15:3014.10.2019 - 27.01.2020Sem.R. DC rot 07 Vorlesung
Techniques of analytical elctron microscopy - Single appointments
DayDateTimeLocationDescription
Mon07.10.201912:00 - 13:00FH Hörsaal 6 Vorbesprechung
Mon14.10.201914:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon21.10.201914:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon04.11.201914:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon11.11.201914:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon18.11.201914:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon25.11.201914:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon02.12.201914:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon09.12.201914:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon16.12.201914:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon13.01.202014:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon20.01.202014:00 - 15:30Sem.R. DC rot 07 Vorlesung
Mon27.01.202014:00 - 15:30Sem.R. DC rot 07 Vorlesung

Examination modalities

Certificate

Course registration

Not necessary

Curricula

Literature

Lecture notes (in German language) are available at the beginning of the lecture series.

Previous knowledge

Positive examination in "VO 133.293 - Fundamentals of Electron Microscopy" is advised.

Preceding courses

Accompanying courses

Miscellaneous

Language

German