After successful completion of the course, students are able to comprehend the materials presented in the course and to draw conclusions from them, as well as to actively communicate the contents presented during the course.

Principle of transmission electron microscopy (TEM)
Practical work
Setup, alignment
- illuminating system
- objective lens
- lens aberrations

Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images

Microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)

Interactive Course

Vorbesprechung: Dienstag, 01.03.2022, 16.00-18.00 Uhr, FH 8 Nöbauer HS
Planned dates for SS 2022:

There will be three blocks. Due to COVID-19, there will be at most 3 participants per block. The second block is dedicated to English speaking students. Please indicate your language requirement when applying to be enrolled.

Theory lecture
Fri 11.03.2022 10:00 - 12:30 TUWEL/Zoom

TEM work takes place in the TEM laboratories, 8th floor, yellow tower of the Freihaus, Wiedner Hauptstraße 8-10. Duration: 9am - 1 pm (unless noted otherwise)
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Mon 14.03. (13-17); Tue 15.03.; Wed 16.03.; Thu 17.03.
Mon 21.03.; Tue 22.03.; Wed 23.03.; Thu 24.03. (13-17)
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Certificate

Due to the current situation, the internship in the SS2022 can unfortunately only be carried out in very small groups in a very limited and safety-conscious manner.

Priority is given to those students who need transmission electron microscopy directly for their research and who will apply it independently.

Unfortunately, there is no guarantee for an internship.
Please contact Michael Stöger-Pollach (michael.stoeger-pollach@tuwien.ac.at) to register and to make further plans. A letter of interest is required. Also include your language requirements.

Lecture notes for this course are available.

Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)
Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (recommended) (2008) 

Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)