After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.
Principle of transmission electron microscopy (TEM)
Practical work Setup, alignment :
- illuminating system
- objective lens
- lens aberrations Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images(CCD, plate camera) microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)
Due to the current situation, the practical training in the WS2020/21 can unfortunately only be carried out in a very limited and safety-conscious manner in small groups.
Priority is given to those students who need transmission electron microscopy directly for their research and who will apply it independently.
Unfortunately, there is no guarantee for participation in the praktikum.
Therefore, if you are interested, please contact one of the lecturers in order to make further plans.
Due to the current situation, the internship in the WS2020/21 can unfortunately only be carried out in very small groups in a very limited and safety-conscious manner.
Priority is given to those students who need transmission electron microscopy directly for their research and who will apply it independently.
Unfortunately, there is no guarantee for an internship.
Please contact one of the lecturers to register and to make further plans.
Lecture notes for this course are available.
Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)
Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (2008) (recommended)
Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Einführung in die Elektronenmikroskopie - Heimendahl, Manfred von (1984)
Electron microscopy of materials - Heimendahl, Manfred von (1980)
Electron microscopy of thin crystals - Hirsch, P. B. (1977)
High-resolution electron microscopy - Spence, John C. H. (2008)
Transmission electron microscopy of materials - Thomas, Gareth (1990) Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)
