After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.
Principle of transmission electron microscopy (TEM)
Practical work Setup, alignment :
- illuminating system
- objective lens
- lens aberrations Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images(CCD, plate camera) microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)
The first block is dedicated to english speaking students. Please enroll in this block if you don't speak any german. (Please use group registration)
Theory lecture
Fri 06.03.2020 12:00 - 14:00 SEM DB07 yellow tower
TEM work takes place in the TEM laboratories, 8th floor, yellow tower of the Freihaus, Wiedner Hauptstraße 8-10. Duration: 9 am - 1 pm.
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Mon 09.03.; Tue 10.03.; Wed 11.03.; Thu 12.03.
Mon 16.03.; Tue 17.03.; Wed 18.03.; Thu 19.03.
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Lecture notes for this course are available.
Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)
Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (recommended) (2008)
Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)
