Principle of transmission electron microscopy (TEM)
Practical work Setup, alignment :
- illuminating system
- objective lens
- lens aberrations Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images(CCD, plate camera) microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)
The first block is dedicated to english speaking students. Please enroll in this block if you don't speak any german. (Please use group registration)
Theory lecture
Fri 01.03.2019
TEM work takes place in the TEM laboratories, 8th floor, yellow tower of the Freihaus, Wiedner Hauptstraße 8-10. Duration: 9 am - 1 pm.
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Mon 04.03.; Tue 05.03.; Wed 06.03.; Thu 07.03.
Mon 11.03.; Tue 12.03.; Wed 13.03.; Thu 14.03.
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Lecture notes for this course are available.
Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)
Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (recommended) (2008)
Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)