Principle of transmission electron microscopy (TEM)
Practical work Setup, alignment :
- illuminating system
- objective lens
- lens aberrations Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images(CCD, plate camera) microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)
The first block is dedicated to english speaking students. Please enroll in this block if you don't speak any german.
-----------------------------------------------------
Lecture for all groups together
Fr 05.10.2018 SEM DB rot 07, 12 am - 2 pm
-----------------------------------------------------
Gruppe 1 (reserved for english speaking students)
Mo, 08. Oct 2018
Tu, 09. Oct 2018
We, 10. Oct 2018
Th, 11. Oct 2018
Mo, 15. Oct 2018
Tu, 16. Oct 2018
We, 17. Oct 2018
Th, 18. Oct 2018
-----------------------------------------------------
Lecture notes for this course are available.
Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)
Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (2008) (recommended)
Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Einführung in die Elektronenmikroskopie - Heimendahl, Manfred von (1984)
Electron microscopy of materials - Heimendahl, Manfred von (1980)
Electron microscopy of thin crystals - Hirsch, P. B. (1977)
High-resolution electron microscopy - Spence, John C. H. (2008)
Transmission electron microscopy of materials - Thomas, Gareth (1990) Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)