Principle of transmission electron microscopy (TEM)
Practical work Setup, alignment :
- illuminating system
- objective lens
- lens aberrations Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images(CCD, plate camera) microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)
The first block is dedicated to english speaking students. Please enroll in this block if you don't speak any german. (Please use group registration)
Theory lecture
Fri 03.03.2016 SEM DB 07 yellow 12:00 - 14:00
TEM work takes place in the TEM laboratories, 8th floor, yellow tower of the Freihaus, Wiedner Hauptstraße 8-10. Duration: 9 am - 1 pm.
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Mon 06.03.; Tue 07.03.; Wed 08.03.; Thu 09.03.
Mon 13.03.; Tue 14.03.; Wed 15.03.; Thu 16.03.
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Lecture notes for this course are available.
Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)
Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (recommended) (2008)
Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)