After successful completion of the course, students are able to understand the preparation and characterisation of surfaces of solids, as well as instruments for surface spectroscopy and analysis, and to explain different methods for the analysis of the chemical composition, geometric and electronic structures.

Preparation and characterization of surfaces of solids, instruments for spectroscopy and analysis of surfaces. Methods for chemical analysis (XPS, AES, SIMS, ISS, TDS), determination of the geometrical structure (STM/AFM, FIM, LEED) and investigation of the electronic structure (UPS, IPES, NEXAFS).

Presentation of the methods as well as examples from research work in the lecture. Lecture notes (German, slides in English) and further supporting material such as video animations of the underlying physics.

On demand, the course will be given in English.

Oral examination

Please register in TISS to the download documents.

Lecture notes for this course (in German) are available in TISS (under "documents") if you register for the course.

For the 2020 course, also English slides with audio (and some video) are made available in TISS.

Further literature:

• A. Zangwill: Physics of Surfaces (Cambridge University Press)
• H. Lüth: Surfaces and Interfaces of Solid Materials (Springer).
• For more literature, see the lecture notes or the first slides.

Basic knowledge in solid state, quantum and atomic physics.