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133.031 High Resolution Electron Microscopy (HREM)
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2022W, VO, 2.0h, 3.0EC


  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VO Lecture
  • Format: Hybrid

Learning outcomes

After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.

Subject of course

Basic introduction into the technique of HREM/ Experimental prerequisites for HREM: Electron optics and wave aberrations, Contrast transfer function of the microscope/ Dynamic diffraction theories for the perfect crystal/ Computer simulation of image contrast / Analysis of crystal lattice defects of selected semiconductors and ceramics / Image processing and quantitative HREM/ Discussion of merits and limits of HREM

Teaching methods

Frontal lecture

Mode of examination

Written and oral



Examination modalities


Course registration

Registration modalities

Seminarraum, 8.Stock Ort: nach der Vorbesprechung, bei Beginn der Vorlesung


Study CodeObligationSemesterPrecon.Info
066 461 Technical Physics Mandatory elective
066 461 Technical Physics Mandatory elective
810 Technical Physics Mandatory elective


Lecture notes for this course are available. wird bei Beginn der Vorlesung ausgegeben Price: 10.0 Z. Wang Elastic and Inelastic Scattering in Electron Diffraction and Imaging, Plenum

Previous knowledge

Basic mathematics and physics, some knowledge on basic electron microscopy and solid state physics is useful.