133.027 Electron microscopy of semiconducting materials, project task
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2023S, PR, 8.0h, 10.0EC, to be held in blocked form


  • Semester hours: 8.0
  • Credits: 10.0
  • Type: PR Project
  • Format: Online

Learning outcomes

After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.

Subject of course

Preparation of specimens for TEM, introduction to practical usage of the TEM instrument. Introduction to measure image contrast and diffraction information. Usage of computer simulation programs for the interpretation of defect analysis. Solving a practial problem of a TEM analysis of semiconductors or ceramics.

Teaching methods

Interactive Course

Mode of examination




Examination modalities


Course registration

Registration modalities

via email to stoeger@ustem.tuwien.ac.at


Study CodeObligationSemesterPrecon.Info
033 261 Technical Physics Not specified
066 460 Physical Energy and Measurement Engineering Not specified
066 461 Technical Physics Not specified
810 Technical Physics Mandatory elective


No lecture notes are available.

Previous knowledge

basic knowledge of solid state physics is useful and VO Fundamentals of Electron Microscopy (133.293)


  • Attendance Required!