057.019 Modern diffraction methods for residual stress and structure analysis
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2020S, VU, 2.0h, 3.0EC, to be held in blocked form
TUWEL

Properties

  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VU Lecture and Exercise

Learning outcomes

After successful completion of the course, students are able to apply and choose diffractionn methods; sample selection and preparation; independent self-organized experimental work; calculation and interpretation of results; proposing experiments; planning of preliminary (complementary) testing.

Subject of course

Basics of diffraction techniques on polycrystalline materials; microstructure and texture of heterogeneous materials; definition and qualification of residual stresses and their origins; texture in polycrystalline materials and its properties


X-ray diffraction in the lab; function principles; applicability and physical boundaries; residual stress calculation by sin2psi method; error determination; texture analysis

Alternative beam techniques; neutron radiation; synchrotron radiation; sources; detectors; sample environment; diffraction setup; analysis and calculation methods

Teaching methods

Diffraction experiments in the X-ray

Analysis of results

Writing of experimental proposals

Mode of examination

Oral

Lecturers

Institute

Course dates

DayTimeDateLocationDescription
Wed10:30 - 11:3004.03.2020 GM 3 Vortmann HörsaalVorbesprechung
Mon09:00 - 10:0029.06.2020 XRC / Wirtschaftsgebäude (BL) / 1. Stock / Raumnummer BLO1G05Vorbesprechung / Anmeldung
Course is held blocked

Examination modalities

Oral exam

Course registration

Not necessary

Curricula

Study CodeObligationSemesterPrecon.Info
ALG For all Students Elective

Literature

No lecture notes are available.

Language

German